1. A method of precisely comparing and positioning speckle patterns, comprising: (A): setting an original coordinate, and using a sensor to measure an instantaneous speckle pattern of a target surface, to obtain an original speckle pattern, wherein the original speckle pattern comprises a first complex original coordinate value and a corresponding first complex light intensity value; (B): the sensor and the target surface performing a relative movement, and the sensor measuring the instantaneous speckle pattern of the target surface after the relative movement, to obtain a comparison speckle pattern, wherein the comparison speckle pattern comprises a second complex original coordinate value and a corresponding second complex light intensity value; and (C): setting a set of precise coordinates, and using a precise comparison algorithm to compute the original speckle pattern and the comparison speckle pattern, so as to obtain a relative displacement after the computation; wherein the precise coordinate is composed by subdividing sub-pixel displacement into a plurality of unit angular displacement vectors; wherein the relative displacement is located on the precise coordinate, and a coordinate accuracy of the precise coordinate is smaller than a coordinate accuracy of the original coordinate.

專利

S11108A0186

National Chung-Shan Institute of Science & Technology(國家中山科學研究院)

研究機構

概念

2022/08/09

專利_非專屬授權,

2024/07/30